The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2019

Filed:

Aug. 11, 2017
Applicant:

SK Hynix Inc., Icheon-si, Gyeonggi-do, KR;

Inventor:

Ja Beom Koo, Icheon-si, KR;

Assignee:

SK hynix Inc., Icheon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3193 (2006.01); G11C 29/02 (2006.01); G11C 5/04 (2006.01); G11C 29/38 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3193 (2013.01); G01R 31/31935 (2013.01); G11C 5/04 (2013.01); G11C 29/025 (2013.01); G11C 29/38 (2013.01);
Abstract

A memory device may be provided. The memory device may include a test data output circuit configured to compare lower data output from a lower data storage region with upper data output from an upper data storage region and make a decision. The memory device may include a data transmitter configured to output the lower data by inverting or noninverting the lower data according to the decision. The memory device may include a test control circuit generates a test control signal according to a test read signal and an address signal.


Find Patent Forward Citations

Koo, Ja. (2019). Memory apparatus relating to determination of a failed region and test method thereof, memory module and system using the same (U.S. Patent No. 10302701). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10302701

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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