The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2019

Filed:

Feb. 17, 2017
Applicant:

Sysmex Corporation, Kobe, JP;

Inventors:

Yuji Wakamiya, Kobe, JP;

Kazutoshi Tokunaga, Kakogawa, JP;

Assignee:

SYSMEX CORPORATION, Kobe-shi, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/10 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00613 (2013.01); G01N 35/00663 (2013.01); G01N 35/00732 (2013.01); G01N 35/00871 (2013.01); G01N 35/1011 (2013.01); G01N 2035/00673 (2013.01); G01N 2035/00782 (2013.01); Y10T 436/117497 (2015.01);
Abstract

A sample analyzing method of a sample analyzer for measuring samples, using a reagent container which comprises a writable and readable storage medium, the sample analyzing method including: storing information regarding a remaining amount of a reagent in the reagent container to a memory of the analyzer read from the storage medium; updating the information in the memory in response to an aspiration of the reagent; and writing updated information in the memory to the storage medium when an aspiration of the reagent in a plurality of measurements is completed. The writing of the updated information is postponed until the aspiration of the reagent in the plurality of measurements is completed.


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