The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2019
Filed:
Dec. 16, 2016
Applicants:
Miyuki Hirata, Mie, JP;
Rie Kobayashi, Kanagawa, JP;
Mio Akima, Tokyo, JP;
Inventors:
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/75 (2006.01); G01N 33/543 (2006.01); G01N 33/558 (2006.01); G01N 33/52 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54393 (2013.01); G01N 33/525 (2013.01); G01N 33/54386 (2013.01); G01N 33/558 (2013.01);
Abstract
Provided is a thermal transfer medium for a testing device, the thermal transfer medium including a support, a solid-phase reagent layer provided over the support and containing a reagent over a surface of the solid-phase reagent layer; and a protective layer provided over the solid-phase reagent layer in a manner to cover the reagent, wherein an average thickness of the protective layer is 0.5 μm or greater but 30 μm or less.