The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2019
Filed:
Apr. 25, 2018
Applicant:
Emage Vision Pte. Ltd., Singapore, SG;
Inventor:
Sergey Smorgon, Singapore, SG;
Assignee:
EMAGE VISION PTE. LTD., Singapore, SG;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/958 (2006.01); A61F 2/16 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/958 (2013.01); A61F 2/16 (2013.01); G01N 21/8806 (2013.01); G01N 2021/8822 (2013.01); G01N 2021/9583 (2013.01);
Abstract
An inspection system and method to inspect for defects in molding, contamination, scratches, damage and any form of deformation in intraocular lens comprising three main building blocks; a Top illumination light head that includes a Top lens light head and a Top flat light head; a Dark field illumination light head, a Bright field illumination light head; a Single spot illumination light head; a image acquisition and processing system which captures images of the lens loaded in trays; analyzing the image to detect the various defects; making a conclusion to reject or accept the lens, based on the analyzed image.