The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2019

Filed:

Dec. 15, 2010
Applicants:

Anoop Agrawal, Tucson, AZ (US);

Juan Carlos L. Tonazzi, Tucson, AZ (US);

Lori L. Adams, Tucson, AZ (US);

John P. Cronin, Tucson, AZ (US);

Inventors:

Anoop Agrawal, Tucson, AZ (US);

Juan Carlos L. Tonazzi, Tucson, AZ (US);

Lori L. Adams, Tucson, AZ (US);

John P. Cronin, Tucson, AZ (US);

Assignee:

Berylliant, Inc., Tucson, AZ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/643 (2013.01); G01N 21/6452 (2013.01);
Abstract

Use of high throughput methods to analyze samples for toxic elements originating from industrial hygiene and environmental sampling are described. These methods utilize optical detection methods using plates with arrays and microwells. Methods to fabricate samples in such plates are described. The invention is particularly illustrated by demonstrating its applicability for analysis of beryllium by fluorescence and uranium by phosphorescence. This invention also discloses the use of improved filtration method and use of reagents with low background signals.


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