The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2019
Filed:
Dec. 18, 2017
Fundació Institut DE Ciències Fotóniques, CASTELLDEFELS (Barcelona), ES;
Institució Catalana DE Recerca I Estudis Avançats, BARCELONA, ES;
Valerio Pruneri, Castelldefels, ES;
Pedro A. Martínez, Castelldefels, ES;
Marc Jofre, Castelldefels, ES;
Fundacio Institute de Ciencies Fotoniques, Castelldefels, Barcelona, ES;
Institucio Catalana de Recerca I Estudis Avancatis, Barcelona, ES;
Abstract
Apparatus for measuring light scattering of a sample comprising a light beam source, means for collimating the beam and making it impinge on the sample in a perpendicular direction, at least one light sensor, and at least one spatial filter between the sample and the optical sensor, provided with two apertures, means for measuring the total power reaching the sensor and means for measuring the power of beams with a low k vector after the beam traverses the filter. The invention provides thus a simplified, portable and compact device for measuring different parameters like haze, turbidity, etc. can be built, for any sample and without the need of changing detectors.