The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2019
Filed:
Jul. 14, 2016
The United States of America, As Represented BY the Administrator of the National Aeronautics and Space Administration, Washington, DC (US);
William T. Yost, Newport News, VA (US);
Daniel F. Perey, Yorktown, VA (US);
THE UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA, Washington, DC (US);
Abstract
Systems, methods, instruments and devices of the various embodiments enable improved characterization and comparison of the level and species of surface contaminants from photo-induced emission analysis. The various embodiments may provide flexibility for calculating and analyzing the time-dependence of emission efficiencies. Irregular and heterogeneous surfaces, including regionally multiply-connected surface compositions, may be analyzed according to the various embodiments, and the various embodiments include techniques that support specific contaminant identification. Various embodiment focusing techniques may enhance assessment of spatially differential regional analysis of the substrate for more critical applications. The various embodiments may also include differential comparison with reference surfaces, either through differential comparison while scanning, or by comparison to digitally stored responses to known contaminants.