The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2019
Filed:
Aug. 22, 2017
Harris Corporation, Melbourne, FL (US);
Christopher E. Lietzke, Fort Wayne, IN (US);
John R. Holder, Fort Wayne, IN (US);
Anthony Wayne New, Fort Wayne, IN (US);
Harris Corporation, Melbourne, FL (US);
Abstract
A technique for measuring atmospheric conditions includes: at a computing device, receiving, from an imager, image data representing an image of an atmospheric region; creating a cloud mask from the image data, the cloud mask including a cloud area corresponding a first area in the image that is cloud covered and a non-cloud area corresponding a second area in the image that is substantially without cloud cover; determining a measurement location in the non-cloud area that is spaced apart from a boundary of the cloud area and from edges of the cloud mask; steering a line of sight of a sensor to correspond to the measurement location; and measuring an atmospheric condition with the sensor at the measurement location within the non-cloud area.