The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2019
Filed:
May. 17, 2018
Applicant:
Ocean Optics, Inc., Largo, FL (US);
Inventor:
Kirk Clendinning, Winter Springs, FL (US);
Assignee:
Ocean Optics, Inc., Largo, FL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/04 (2006.01); G01J 3/02 (2006.01); G01J 3/14 (2006.01); G02B 6/26 (2006.01);
U.S. Cl.
CPC ...
G01J 3/04 (2013.01); G01J 3/021 (2013.01); G01J 3/0208 (2013.01); G01J 3/0221 (2013.01); G01J 3/14 (2013.01); G01J 3/28 (2013.01); G02B 6/26 (2013.01);
Abstract
An optical slit device that combines microelectromechanical design techniques, semiconductor laser technology, and micro-optics to provide a spectrometer entrance slit on a semiconductor substrate with integrated calibration light sources, which integrated light enters the entrance slit and is transmitted down the same optical path as a light source under test and by which the spectrometer can be wavelength calibrated in situ is disclosed.