The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2019
Filed:
Oct. 18, 2016
Topcon Corporation, Itabashi-ku, JP;
Hiroki Nagashima, Itabashi-ku, JP;
Hajime Shinozaki, Itabashi-ku, JP;
TOPCON CORPORATION, Tokyo, JP;
Abstract
The efficiency of the work for measuring electromagnetic waves is increased. A measuring device includes a position information obtaining unit, an electromagnetic wave information obtaining unit, a data storage unit, and a selecting unit. The position information obtaining unit obtains position information of a reflective prism, which is measured by a position measuring device. The electromagnetic wave information obtaining unit obtains illuminance information measured by an illuminometer, which is in the proximity of the reflective prism. The data storage unit stores the position information of the reflective prismand the illuminance information in association with each other. The selecting unit compares information of predetermined measurement planned positions with the position information of the reflective prismand selects the illuminance information at a position that has a specific relationship relative to one of the measurement planned positions.