The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2019
Filed:
Feb. 07, 2013
Nxp B.v., Eindhoven, NL;
Ewout Brandsma, Eindhoven, NL;
Maarten Christiaan Pennings, Waalre, NL;
Aly Aamer Syed, Deurne, NL;
Timo van Roermund, Eindhoven, NL;
NXP B.V., Eindhoven, NL;
Abstract
According to an aspect of the invention a method for calibrating a measurement device is conceived wherein: a calibration device is brought into close proximity of the measurement device such that a data communication link is established between the measurement device and the calibration device; wherein the following steps are performed while the calibration device and the measurement device are in close proximity of each other: the calibration device performs a measurement of at least one physical phenomenon; the measurement device performs a measurement of the same physical phenomenon; the result of the measurement by the measurement device is compared with the result of the measurement by the calibration device; and calibration parameters are computed based on a difference between the result of the measurement by the measurement device and the result of the measurement by the calibration device.