The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2019
Filed:
Dec. 15, 2016
Seiko Epson Corporation, Tokyo, JP;
Teruyuki Inukai, Matsumoto, JP;
Seiko Epson Corporation, , JP;
Abstract
A measurement system includes a projection section that switches first pattern light having a fringe pattern to second pattern light having a fringe pattern containing a greater number of fringes than the first pattern light and vice versa and projects the selected light on an object to be measured, an imaging section that has a plurality of pixels and images the first pattern light and the second pattern light projected on the object to be measured, a phase shift section that shifts the phase of the first pattern light and the second pattern light projected by the projection section on the object to be measured, and an analysis section that analyzes results of the imaging performed by the imaging section by relating the fringes contained in the first pattern light and the second pattern light to the plurality of pixels.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile