The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2019
Filed:
Nov. 05, 2013
The Regents of the University of California, Oakland, CA (US);
Amy Rowat, Santa Monica, CA (US);
David J. Hoelzle, South Bend, IN (US);
Clara Chan, Los Angeles, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
This invention provides methods and devices for the high-throughput characterization of the mechanical properties of cells or particles. In certain embodiments the devices comprise a micro fluidic channel comprising: an oscillating element on a first side of said channel; and a detecting element on a second side of said channel opposite said oscillating element, wherein said detecting element is configured to detect a force transmitted through a cell or microparticle by said oscillating element. In certain embodiments the devices comprise a microfluidic channel comprising an integrated oscillator and sensor element on one first side of said channel, wherein said sensor is configured to detect a force transmitted through a cell or microparticle by said oscillator.