The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2019
Filed:
Feb. 06, 2017
Applicant:
Illumina, Inc., San Diego, CA (US);
Inventors:
Jason Harris, San Diego, CA (US);
Stephen Tanner, San Diego, CA (US);
Assignee:
ILLUMINA, INC., San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2018.01); C12Q 1/6837 (2018.01); B01J 19/00 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/6837 (2013.01); B01J 19/0046 (2013.01); B01J 2219/00527 (2013.01); B01J 2219/00605 (2013.01); B01J 2219/00608 (2013.01); B01J 2219/00659 (2013.01); B01J 2219/00662 (2013.01); B01J 2219/00693 (2013.01); B01J 2219/00722 (2013.01);
Abstract
The present techniques provides methods for use in conjunction with an article of manufacture having a plurality of sample sites of an array and to identify sample sites based on image data. The array may be divided into a series of domains with each domain having patterns of sample sites. Neighboring domains may be oriented at different angles such that each domain does not have the same pattern orientation.