The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2019

Filed:

Nov. 23, 2016
Applicant:

The Charles Stark Draper Laboratory, Inc., Cambridge, MA (US);

Inventors:

Joseph Shoer, Cambridge, MA (US);

Leena Singh, Lexington, MA (US);

Sungyung Lim, Acton, MA (US);

Timothy Henderson, Ashland, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B64G 1/36 (2006.01); B64G 1/24 (2006.01);
U.S. Cl.
CPC ...
B64G 1/363 (2013.01); B64G 1/36 (2013.01); B64G 2001/245 (2013.01);
Abstract

A conical scanning method and system is provided for orienting a spacecraft with respect to a source. The system includes a spacecraft and an incidence angle sensor secured to the spacecraft to sense a signal from a source. The incidence angle sensor has a boresight that is canted with respect to the principal axis. A processor communicates with actuators on the spacecraft to adjust an attitude of the spacecraft based on information received from the incidence angle sensor and to thereby align a principal axis of the spacecraft with a direction from the spacecraft to the source. The method and system can also rely on information received from source presence sensors. The source may be the Sun, or a non-solar signal source.


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