The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2019

Filed:

Jul. 29, 2016
Applicant:

Sekisui Chemical Co., Ltd., Osaka-shi, Osaka, JP;

Inventors:

Hiroshi Kawate, Shiga, JP;

Koji Kido, Shiga, JP;

Shougo Yoshida, Shiga, JP;

Michiko Mori, Shiga, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 3/30 (2006.01); B60J 1/02 (2006.01); B29C 48/00 (2019.01); B29C 48/08 (2019.01); B29C 48/21 (2019.01); B29C 48/88 (2019.01); B29C 59/02 (2006.01); B29K 29/00 (2006.01); B29L 31/30 (2006.01); B32B 17/10 (2006.01);
U.S. Cl.
CPC ...
B32B 17/10587 (2013.01); B29C 48/002 (2019.02); B29C 48/08 (2019.02); B29C 48/21 (2019.02); B32B 3/30 (2013.01); B32B 17/10596 (2013.01); B32B 17/10761 (2013.01); B29C 48/919 (2019.02); B29C 59/022 (2013.01); B29C 59/026 (2013.01); B29C 2059/023 (2013.01); B29K 2029/14 (2013.01); B29L 2031/3052 (2013.01); B32B 2605/006 (2013.01); B60J 1/02 (2013.01);
Abstract

The present invention aims to provide an interlayer film for a laminated glass which enables production of a laminated glass with suppressed occurrence of optical distortion, a method for producing the interlayer film for a laminated glass, and a laminated glass produced using the interlayer film for a laminated glass. The present invention relates to an interlayer film for a laminated glass produced by an extrusion lip embossing method utilizing melt fracture, the interlayer film for a laminated glass including a laminate that includes two or more resin layers in a stack and having a large number of protrusions and recesses on at least one surface, a maximum height Ry (μm) and an average interval Sm (μm) of the protrusions and recesses measured in conformity with JIS B 0601 (1994) on the surface with protrusions and recesses satisfying a formula (1):()/2≤3,500  (1).


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