The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2019

Filed:

Jun. 10, 2016
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Sasa Grbic, Princeton, NJ (US);

Philipp Hoelzer, Bubenreuth, DE;

Razvan Ionasec, Nuremberg, DE;

Michael Suehling, Erlangen, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 34/10 (2016.01); A61F 2/30 (2006.01);
U.S. Cl.
CPC ...
A61B 34/10 (2016.02); A61F 2/30942 (2013.01); A61B 2034/102 (2016.02); A61F 2002/30948 (2013.01); A61F 2002/30952 (2013.01); A61F 2002/30955 (2013.01); A61F 2002/30962 (2013.01); G06T 2200/04 (2013.01);
Abstract

At least one first 3D image dataset of an examination region of interest of a patient and a second 3D image dataset of the examination region of interest are received via at least one first interface. A geometric model of the examination region of interest is determined based at least on the first 3D image dataset, and a first spatial distribution of a first material property of the examination region of interest is determined based at least on the second 3D image dataset. A digital manufacturing model of an object is generated based on the geometric model and on the first spatial distribution, the manufacturing model having a material composition of the object that is dependent on the first distribution. The manufacturing model therefore takes into account the geometry and the first material property of the examination region of interest.


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