The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2019

Filed:

Dec. 21, 2016
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Takafumi Ishitsu, Tokyo, JP;

Isao Takahashi, Tokyo, JP;

Kazuma Yokoi, Tokyo, JP;

Makoto Satou, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01); G01T 1/24 (2006.01); G01T 7/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4291 (2013.01); A61B 6/00 (2013.01); A61B 6/03 (2013.01); A61B 6/032 (2013.01); A61B 6/4266 (2013.01); G01T 1/24 (2013.01); G01T 1/241 (2013.01); G01T 7/00 (2013.01);
Abstract

A radiation imaging apparatus provided with a detector capable of improving correction accuracy at a high counting rate. The present invention is provided with: grids that remove scattered beams that emanate from an object; and a plurality of detector sub-pixels arranged so as to divide the gap between the grids into three or more segments, wherein the area of each of the detector sub-pixels located below the wall surface of the grids is larger than that of each of the other detector sub-pixels in a planar view. The size of each of the detector sub-pixels not located below the wall surface of the grids is expressed as (P−T−L×2)/N, where Prepresents the pitch between the grids, Trepresents the thickness of each of the grids, and N represents the number of segments formed by the detector sub-pixels between the grids.


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