The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2019
Filed:
Feb. 17, 2015
Yonsei University Wonju Industry-academic Cooperation Foundation, Wonju-si, Gangwon-do, KR;
YONSEI UNIVERSITY WONJU INDUSTRY-ACADEMIC COOPERATION FOUNDATION, Wonju-si, Gangwon-do, KR;
Abstract
Provided is a method of determining a toggle sequence for error detection based on a soft decision value and a method and apparatus for determining an error pattern, and more particularly, to a method of determining an optimum toggle sequence and error pattern based on a soft decision value in order to allow for faster error (pattern) detection and correction. It is an object of the invention to implement low redundancy, less delay, and a receive-side error correction capability by combining advantages of the conventional ARQ scheme and the conventional FEC scheme using a soft decision reliability. For this purpose, according to a first embodiment of the present invention, in order to optimize the toggle sequence speed, there is provided a method of determining a toggle sequence such that bits are toggled sequentially in the order of a smaller sum of soft decision reliabilities to be toggled.