The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2019
Filed:
Feb. 06, 2018
Sharp Kabushiki Kaisha, Sakai, Osaka, JP;
Tazuko Kitazawa, Sakai, JP;
SHARP KABUSHIKI KAISHA, Sakai, Osaka, JP;
Abstract
Interference noise is eliminated and fitting accuracy is enhanced. A spectrum analysis apparatus includes an electromagnetic wave source configured to emit an electromagnetic wave having a wavelength from 0.1 mm to 10 mm, a spectrometer a detecting section configured to detect an emitted electromagnetic wave that exits from the measurement object, the wave being transmitted through or reflected by the measurement object, and to generate a detection signal; and an analyzing section configured to analyze the detection signal. The analyzing section has a noise eliminating unit configured to generate a noise eliminated signal by eliminating from the detection signal a round-trip electromagnetic wave having reciprocated twice or more inside the measurement object and then emitted from the measurement object, in the emitted electromagnetic wave. Furthermore, the analyzing section is configured to generate a transmission or reflection spectrum that is a corrected detection signal by using the noise eliminated signal.