The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2019

Filed:

Dec. 12, 2017
Applicant:

Novatek Microelectronics Corp., Hsinchu, TW;

Inventors:

Tzong-Honge Shieh, Hsinchu County, TW;

Po-Hsiang Fang, Hsinchu County, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 12/00 (2006.01); G11C 16/08 (2006.01); G01P 21/00 (2006.01); G11C 5/00 (2006.01); H03L 7/00 (2006.01); G11C 16/06 (2006.01); H01L 35/00 (2006.01); H01L 23/58 (2006.01); H01L 21/66 (2006.01); H01L 23/525 (2006.01); G11C 17/16 (2006.01);
U.S. Cl.
CPC ...
H01L 23/58 (2013.01); G11C 17/165 (2013.01); H01L 22/22 (2013.01); H01L 23/5256 (2013.01);
Abstract

The disclosure provides a trimming method, a trimming circuitry, and a trimming system for an IC with memory usage reduction. The method is applicable to a system including a tester, a characteristic adjustable circuit, and a trimming circuitry having a characteristic outputting circuit, a data memory, and a trim memory. The method includes the following steps. Under each condition, output signals respectively corresponding to trim settings are received from the characteristic adjustable circuit by the characteristic outputting circuit to obtain output values of the condition, a statistical parameter associated with the output values of the condition is calculated by the tester. The statistical parameter of at least one of the conditions is written into the data memory by the tester. An optimal trim setting of the characteristic adjustable circuit is determined according to the statistical parameters under all the conditions and written into the trim memory by the tester.


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