The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2019
Filed:
Jun. 30, 2017
Adcole Corporation, Marlborough, MA (US);
James F. Munro, Ontario, NY (US);
Xianping Zhang, Westborough, MA (US);
Adcole Corporation, Marlborough, MA (US);
Abstract
A method for calibrating an optical scanner device implemented by a calibration management apparatus, includes providing instructions to the optical scanner device to scan a calibration surface in a scan pattern based on one or more scan parameters, wherein the one or more scan parameters vary over the scan pattern. The scanning angle for each of the plurality of points in the scan pattern is computed based on an obtained image of a light source emitted from the optical scanner device at a scanning angle for a plurality of points in the scan pattern. A calibration relationship between the computed scanning angles and the corresponding scan parameters is determined for each of the plurality of points in the scan pattern.