The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2019

Filed:

Apr. 06, 2017
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Itaru Otomaru, Kawasaki, JP;

Kazuhiro Miyasa, Narashino, JP;

Kiyohide Satoh, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/33 (2017.01); G06T 7/246 (2017.01);
U.S. Cl.
CPC ...
G06T 7/344 (2017.01); G06T 7/251 (2017.01); G06T 2200/04 (2013.01); G06T 2207/10072 (2013.01); G06T 2207/30068 (2013.01);
Abstract

An image processing apparatus according to an aspect of the disclosure includes a first deformation acquisition unit configured to perform registration of a first image and a second image and acquire a first deformation parameter that expresses a deformation between the first image and the second image by using a first deformation model, a generation unit configured to generate intermediate data that indicates a deformation expressed by the first deformation model and the first deformation parameter, and a second deformation acquisition unit configured to acquire, based on the intermediate data, a second deformation parameter that expresses a deformation, which is indicated by the intermediate data, by using a second deformation model.


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