The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2019

Filed:

Mar. 15, 2017
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Zhaoxia Zhang, ShangHai, CN;

Kun Tao, ShangHai, CN;

Hao Lai, Niskayuna, NY (US);

Ming Yan, Pewaukee, WI (US);

Han Kang, BeiJing, CN;

Assignee:

GENERAL ELECTRIC COMPANY, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06T 5/20 (2006.01); G06T 5/50 (2006.01); G06K 9/62 (2006.01); G06T 5/10 (2006.01); G06T 11/60 (2006.01); G06T 7/13 (2017.01);
U.S. Cl.
CPC ...
G06T 5/001 (2013.01); G06K 9/6212 (2013.01); G06T 5/10 (2013.01); G06T 5/20 (2013.01); G06T 5/50 (2013.01); G06T 7/13 (2017.01); G06T 11/60 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20221 (2013.01); G06T 2207/20224 (2013.01);
Abstract

A method for reducing grid line artifacts in an X-ray image is disclosed, which includes acquiring an X-ray image by scanning an object, wherein the X-ray image comprises grid line artifacts; decomposing the X-ray image into a high frequency image and a low frequency image, wherein the high frequency image comprises the grid line artifacts; filtering the high frequency image to reduce the grid line artifacts in the high frequency image so as to obtain a filtered high frequency image; and combining the filtered high frequency image with the low frequency image to reconstruct an output image. A system adopting the above method is also disclosed.


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