The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10296833 B1

PDF
Full Text
Expired
Date of Patent:
May. 21, 2019

Filed:

Sep. 04, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Prithu Banerjee, Bangalore, IN;

Biplav Srivastava, Noida, IN;

Srikanth Govindaraj Tamilselvam, Chennai, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
G06N 5/022 (2013.01);
Abstract

Methods and arrangements for forecasting at least one attribute of a future event based on a repository of historical event data associated with historical events comparable to the future event. A plurality of event data points are obtained from the repository of historical event data. The plurality of event data points are grouped in accordance with at least one category and a plurality of subcategories to create at least one data tree. Certain of the grouped event data points are designated to form a set of candidate data attributes, and the designated set of candidate data attributes are compared to a set of data attributes from the at least one data tree associated with the future event. Based on the comparing, there is identified a data attribute missing from the set of data attributes from the at least one data tree associated with the future event, and a value for the missing data attribute is forecast. Other variants and embodiments are broadly contemplated herein.


Find Patent Forward Citations

Banerjee, Prithu. (2019). System and method for estimating missing attributes of future events (U.S. Patent No. 10296833). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10296833

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