The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2019

Filed:

Sep. 22, 2014
Applicant:

Ca, Inc., New York, NY (US);

Inventor:

Sreenivas Gukal, Santa Clara, CA (US);

Assignee:

CA, INC., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 7/00 (2006.01); G06F 17/40 (2006.01); G06F 11/30 (2006.01); G06F 16/31 (2019.01);
U.S. Cl.
CPC ...
G06F 17/40 (2013.01); G06F 11/30 (2013.01); G06F 16/31 (2019.01); G06F 2201/81 (2013.01); G06F 2201/815 (2013.01); G06F 2201/88 (2013.01);
Abstract

A log record from a host machine node includes an invariant string and a term. A template identifier is selected, from among template identifiers within a template repository, for a template string matching the invariant string. A sampling count threshold is selected from among a set of sampling count thresholds based on the template identifier and the term. A template-term count is obtained based on a number of earlier log records that were received since the count was reset and have a template identifier and a term that match the template identifier and the term of the log record. Based on the template-term count satisfying the sampling count threshold, an index entry is generated in a sampled log records index based on the log record and the template-term count is reset to a defined value. Based on the template-term count not satisfying the sampling count threshold, the template-term count is incremented.


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