The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2019

Filed:

Jun. 27, 2016
Applicant:

Futurewei Technologies, Inc., Plano, TX (US);

Inventors:

Jiangsheng Yu, San Jose, CA (US);

Hui Zang, Cupertino, CA (US);

Assignee:

Futurewei Technologies, Inc, Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30554 (2013.01); G06F 17/18 (2013.01);
Abstract

A method includes obtaining via a programmed computer, a first set of n random samples and a second set of n+k random samples from a base set of samples where k is a lag, iteratively adding more random samples to the first and second sets from the base set via the programmed computer, obtaining a distance between the first and second sets of random samples by calculating via the programmed computer, an empirical cumulative distribution function (ECDF) for the first and second sets in each iteration until the distance between the ECDFs is below a threshold, and constructing a stable empirical distribution representation via the programmed computer using a number of samples that is a function of the first and second sets whose distance is below the threshold.


Find Patent Forward Citations

Loading…