The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2019

Filed:

Jun. 09, 2016
Applicant:

Honeywell International Inc., Morris Plains, NJ (US);

Inventors:

Abhishek Nikhra, Karnataka, IN;

Ramakrishnan Ganapathi, Karnataka, IN;

Manas Dutta, Karnataka, IN;

Kiran N, Karnataka, IN;

Ravi Kumar R, Karnataka, IN;

Avinash Rajan, Karnataka, JP;

Assignee:

Honeywell International Inc., Morris Plains, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 16/25 (2019.01); G06F 16/2458 (2019.01); H04L 29/06 (2006.01); G05B 19/00 (2006.01);
U.S. Cl.
CPC ...
G06F 16/258 (2019.01); G05B 19/00 (2013.01); G06F 16/2477 (2019.01); H04L 63/08 (2013.01);
Abstract

A system and method of engineering configuration data (ECD) collection for an industrial facility having a first control and instrumentation (C&I) system with first ECD using a first file format and a second C&I system with second ECD data using a second file format, and a data collection server. A first data agent has collection information regarding the first C&I system and a second data agent has collection information regarding the second C&I system. The first data agent collects the first ECD and the second data agent collects the second ECD. The first ECD and the second ECD are translated into one common generic data format. The first ECD and the second ECD are stored after being translated.


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