The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2019
Filed:
Dec. 09, 2016
Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;
Hiroaki Yoshida, Cupertino, CA (US);
Mukul R. Prasad, San Jose, CA (US);
Benjamin Mehne, Berkeley, CA (US);
FUJITSU LIMITED, Kawasaki, JP;
Abstract
A method may include identifying a fault location in a software program. The method may further include generating an instrumentation function with respect to the fault location. In addition, the method may include replacing a statement at the fault location with the instrumentation function and performing a first test execution of the software program with the implemented instrumentation function. The method may also include selecting the fault location for implementation of a repair candidate based on output of the instrumentation function in response to the first test execution and implementing the repair candidate at the fault location as a patch based on the selection. Moreover, the method may include performing a second test execution of the software program with respect to the patch, evaluating the patch based on results of the second test execution, and accepting or rejecting the patch based on the evaluation.