The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2019
Filed:
Oct. 06, 2016
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Mark Grechanik, Chicago, IL (US);
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Abstract
A system and methods for automatically localizing faults for functional field failures that enables users to enter symptoms of a failure that occur during deployment of a given application along with the values of the input and configuration parameters in order to return locations in the source code that are likely to contain specific faults as well as show navigation paths from a suggested to the failure such that the code may be corrected. Successful and faulty runs of a software application are executed, and used to obtain ground facts and a knowledge base. A particular formula for the ground facts and knowledge base is discussed. A Markov Logic Network (MLN) is generated from the ground facts and knowledge base. Abductive reasoning based on the MLN is used to localize faults for the user-entered functional field failures.