The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2019

Filed:

Dec. 28, 2016
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Daniel L. Osiecki, Seattle, WA (US);

Prashant L. Sarma, Bellevue, WA (US);

Monty Vanderbilt, Seattle, WA (US);

David R. Azari, Seattle, WA (US);

Caitlyn R. Schmidt, Seattle, WA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/34 (2006.01); G06F 11/30 (2006.01); G06F 17/30 (2006.01); H04L 12/26 (2006.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
G06F 11/34 (2013.01); G06F 11/3006 (2013.01); G06F 11/3072 (2013.01); G06F 17/30533 (2013.01); H04L 43/02 (2013.01); H04L 43/04 (2013.01); H04L 67/10 (2013.01);
Abstract

Disclosed are various embodiments for processing and storing mass data, where the data may include metrics generated based on performance of an event in a monitored system. Metrics describing a state of a monitored system may be received, accessed, and aggregated to generate a data model that describes performance of the monitored system. The metrics utilized in generating the data model may be disregarded after the data model has been generated. An output describing the state of the monitored system may be generated based on the data model, and the output may be communicated over a network, for example, to a requesting service.


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