The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2019
Filed:
Jun. 01, 2012
Christian Volf Olgaard, Saratoga, CA (US);
Sheguang Yin, San Jose, CA (US);
John Christopher Lukez, Morgan Hill, CA (US);
Christian Volf Olgaard, Saratoga, CA (US);
Sheguang Yin, San Jose, CA (US);
John Christopher Lukez, Morgan Hill, CA (US);
LitePoint Corporation, Sunnyvale, CA (US);
Abstract
A method for testing a device under test (DUT) during a test sequence. In accordance with one embodiment, during a regular, pre-defined test sequence, data packets are transferred from a tester to a device under test (DUT) containing data related to at least one of an identification parameter of the DUT, an operational characteristic of the DUT and a request for data. Examples of such transferred data include address data for identifying the DUT (e.g., a unique media access control (MAC) address) and calibration data for controlling an operational characteristic of the DUT (e.g., signal power levels, signal frequencies or signal modulation characteristics). In accordance with another embodiment, the DUT retrieves and transmits data to the tester, either in response to the request for data or as a preprogrammed response to its synchronization with the tester.