The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2019
Filed:
Jun. 09, 2016
Honeywell International Inc., Morris Plains, NJ (US);
Abhishek Nikhra, Karnataka, IN;
Ramakrishnan Ganapathi, Karnataka, IN;
Manas Dutta, Karnataka, IN;
Kiran N, Karnataka, IN;
Ravi Kumar R, Karnataka, IN;
Honeywell International Inc., Morris Plains, NJ (US);
Abstract
A method of detecting and tracking changes in engineering configuration data (ECD) for control and instrumentation (C&I) systems an industrial facility. First ECD in a first data format used in a first C&I system and second ECD in a second data format used in a second C&I system are converted into a common format. The first and second ECD are stored together as reference snapshot data with a timestamp in a single information source. At a second time, after the first time reflected in the timestamp, the first and second ECD are obtained. The first ECD and the second ECD obtained at the second time are converted into the common format that collectively provides updated snapshot data. Changes are detected between the first ECD and the second ECD by comparing the reference snapshot data to the updated snapshot data.