The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2019

Filed:

Jul. 13, 2018
Applicant:

Cognex Corporation, Natick, MA (US);

Inventors:

Benjamin Braker, Louisville, CO (US);

Aaron Wegner, Longmont, CO (US);

Ronald Zimmerman, Boulder, CO (US);

Eric Moore, Longmont, CO (US);

Trevor McDonald, Lafayette, CO (US);

Assignee:

COGNEX CORPORATION, Natick, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01S 7/481 (2006.01); G01B 11/00 (2006.01); G01B 11/25 (2006.01); G06T 7/521 (2017.01); G01S 17/42 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4814 (2013.01); G01B 11/002 (2013.01); G01B 11/2531 (2013.01); G01S 17/42 (2013.01); G06T 7/521 (2017.01); G06T 2207/20056 (2013.01);
Abstract

Methods, systems, and devices involving patterned radiation are provided in accordance with various embodiments. Some embodiments include a device for projecting pattern radiation. Some embodiments include a method for estimating coordinates of a location on an object in a 3D scene. Some embodiments include a system for estimating the coordinates of a location on an object in a 3D scene. A variety of radiation patterns are provided in accordance with various embodiments. Some embodiments may relate to the use of patterned illumination to identify the angular information that may be utilized to measure depth by triangulation.


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