The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2019

Filed:

Feb. 09, 2017
Applicant:

Dpix, Llc, Colorado Springs, CO (US);

Inventors:

Kevin Cadena, Pueblo, CO (US);

Kevin Granaas, Colorado Springs, CO (US);

John Luther, Colorado Springs, CO (US);

Shawn Michael O'Rourke, Colorado Springs, CO (US);

Assignee:

DPIX, LLC, Colorado Springs, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/073 (2006.01); G01R 31/26 (2014.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 1/0735 (2013.01); G01R 31/2601 (2013.01); G01R 31/2642 (2013.01); G01R 31/2886 (2013.01); G01R 31/2808 (2013.01); G01R 31/2831 (2013.01); G01R 31/2851 (2013.01);
Abstract

A flexible probe card according to the present invention includes a compression layer; a transport layer coupled to the compression layer; and a contact layer coupled to the transport layer. The compression layer is formed of encapsulated closed cell polyurethane foam. The transport layer includes connectors for coupling the flexible probe card to a tester. The contact interface layer includes embedded conductive wires placed in a fixed grid pattern in a silicon rubber layer, without a specific connector pattern associated either with the transport layer or a device under test.


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