The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2019
Filed:
Mar. 12, 2014
Denka Seiken Co., Ltd., Chuo-ku, JP;
Takashi Miyazawa, Gosen, JP;
Yuki Shinohara, Gosen, JP;
Denka Seiken Co., Ltd., Tokyo, JP;
Abstract
The present invention provides a test kit capable of rapid and highly sensitive detection. The test kit is provided with a first member, which contains a region in which is held a labeling substance with a label immobilized on a substance that specifically binds with a substance to be detected, and a second member, which has a detection zone where the labeling substance is captured through the substance to be detected, which is connected downstream of the first member in the developing direction, and which allows the labeling substance contained in a liquid sample that flows in from the first member, to develop into the detection zone. The first member has a dropping region located furthermost upstream and containing a portion onto which the liquid sample is dropped, a labeling substance holding region connected to the second member and having a containing portion that contains the labeling substance and a non-containing portion that is located upstream of the containing portion and that does not contain the labeling substance, and a backflow prevention region, which is connected between the dropping region and the non-containing portion of the labeling substance holding region, and in which absorbency is set higher than in the dropping region.