The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2019
Filed:
Oct. 15, 2015
Applicant:
Zetec, Inc., Snoqualmie, WA (US);
Inventors:
Laurent Enenkel, Quebec, CA;
Frederic Morrow, St. Jean-Chrysostome, CA;
Alexandre Charlebois, St. Etienne de Lauzon, CA;
Martin Garneau, Quebec, CA;
Stephane Turgeon, St. Nicolas, CA;
Assignee:
ZETEC, INC., Snoqualmie, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/90 (2006.01); G01N 29/06 (2006.01); G01N 29/22 (2006.01); G01N 29/265 (2006.01);
U.S. Cl.
CPC ...
G01N 29/226 (2013.01); G01N 27/9013 (2013.01); G01N 29/0618 (2013.01); G01N 29/0636 (2013.01); G01N 29/0645 (2013.01); G01N 29/225 (2013.01); G01N 29/265 (2013.01);
Abstract
A system for displaying an area covered in a non-destructive scan of an area larger than the test probe is disclosed. Position encoders are included on the test probe to track the motion of the probe and to provide a record of the portion of the area under test that has been covered by the probe.