The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2019
Filed:
Jun. 17, 2015
Bentley Systems, Incorporated, Exton, PA (US);
Zheng Y. Wu, Watertown, CT (US);
Guoqing Xu, Bellevue, WA (US);
Bentley Systems, Incorporated, Exton, PA (US);
Abstract
In one example embodiment, an analysis software package implements an improved damage detection technique to identify damaged elements of a structure. The software package accesses a model and receives measured responses resulting from physical testing of the structure under initial conditions and under damaged conditions. The analysis software package may search for a set of damaged elements, wherein the searching is based on an error function that evaluates goodness-of-fit between the model and the structure under damaged conditions based on a discrepancy between a modeled response difference and a measured response difference, wherein the modeled response difference is a difference between modeled responses determined from the model configured to model initial conditions and with selected damaged elements, and the measured response difference is a difference in measured responses determined from physical testing of the structure under the initial conditions and under the damaged conditions.