The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2019
Filed:
Dec. 14, 2016
The United States of America As Represented BY the Administrator of the National Aeronautics and Space, Washington, DC (US);
Roger Rovekamp, Houston, TX (US);
Adam H. Parsons, Houston, TX (US);
Nicolaus A. Radford, Houston, TX (US);
Carolynn J Kanelakos, Houston, TX (US);
Peter Neuhaus, Pensacola, FL (US);
Joshua S. Mehling, Houston, TX (US);
Abstract
In an embodiment, a relative deflection detector may include at least two structural arcs, and a predetermined number of means for measuring position capable of determining the relative deflection in a first component. The at least two structural arcs may be for example, comprised of a first and second structural arc whereby the first and second structural arcs are attached to the first component at respective first and second predetermined locations and whereby each arc is comprised of a respective sequence of indicators, such as, for example, codes inscribed on the outer circumference of each arc. The first and second structural arcs may be positioned in concentric and coplanar relationship with each other. The predetermined number of sensors may be comprised of a first and second optical encoder sensor each positioned in proximate and coplanar relationship with the first and second structural arcs so as to read the first sequence of codes, second sequence of codes, or both, and thereby detect positions of each structural arc (e.g., a first position corresponding to the first structural arc and a second position corresponding to the second structural arc). The first and second positions may be used to calculate and thereby determine a relative deflection of the first component.