The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10292678 B1

PDF
Full Text
Expired
Date of Patent:
May. 21, 2019

Filed:

Sep. 23, 2015
Applicant:

Analogic Corporation, Peabody, MA (US);

Inventors:

Ram Naidu, Newton, MA (US);

Jason Plante, Chardon, OH (US);

Assignee:

Analogic Corporation, Peabody, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); A61B 8/08 (2006.01); A61B 8/00 (2006.01); A61B 34/10 (2016.01);
U.S. Cl.
CPC ...
A61B 8/0841 (2013.01); A61B 8/463 (2013.01); A61B 8/5223 (2013.01); A61B 34/10 (2016.02); A61B 8/5261 (2013.01); A61B 2034/107 (2016.02);
Abstract

A method includes receiving an intra-procedure image of a region of interest of an object. The intra-procedure image includes a representation of an instrument in the object. The method further includes identifying a location of the instrument in the object in the intra-procedure image. The method further includes combining the intra-procedure image with a pre-procedure image of the region of interest. The pre-procedure image includes a planned trajectory for the instrument from a surface of the object to a target in the object and segmented structure(s) to be avoided by the instrument during the procedure. The method further includes segmenting the same structure(s) in the intra-procedure image relative to the instrument using the segmented structure(s) in the pre-procedure image. The method further includes computing a risk of the instrument contacting the structure(s) along the trajectory with the identified location, the trajectory, and the segmented structure(s) in the intra-procedure image.


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Naidu, Ram. (2019). Real-time image based risk assessment for an instrument along a path to a target in an object (U.S. Patent No. 10292678). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10292678

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