The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2019

Filed:

Mar. 17, 2015
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventor:

Yasutaka Konno, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01); G01T 1/29 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4241 (2013.01); A61B 6/032 (2013.01); A61B 6/482 (2013.01); A61B 6/5205 (2013.01); A61B 6/585 (2013.01); G01T 1/2985 (2013.01);
Abstract

In an X-ray scanning apparatus mounted with a photon counting type radiation detector, a data processing device of the X-ray scanning apparatus includes a correction unit that corrects a digital output value in each of the plurality of energy ranges with respect to each X-ray detection element in order to obtain an accurate projection image by correcting a counting error of the number of X-ray photons in each energy range. The correction unit includes an inflow amount calculation portion that calculates a digital amount corresponding to X-ray photons which flow from a certain X-ray detection element to another X-ray detection element, and an energy shift inflow amount/outflow amount calculation portion that calculates a digital amount corresponding to X-ray photons which flow into a high energy range due to energy shift in a single X-ray detection element, and performs correction by using the digital amounts calculated by the calculation portions.


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