The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2019

Filed:

Sep. 20, 2011
Applicants:

Ying Min Wang, Pasadena, CA (US);

Changhuei Yang, Pasadena, CA (US);

Inventors:

Ying Min Wang, Pasadena, CA (US);

Changhuei Yang, Pasadena, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); G01N 21/47 (2006.01); G01N 21/49 (2006.01); G01N 21/65 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0059 (2013.01); G01N 21/1717 (2013.01); G01N 21/47 (2013.01); G01N 21/49 (2013.01); G01N 21/65 (2013.01); G01N 2021/1727 (2013.01); G01N 2021/4709 (2013.01);
Abstract

A method, apparatus, and article of manufacture for irradiating one or more targets within a sample with electromagnetic (EM) radiation. One or more targets within the sample are controllably defined with an acoustic field. The sample is irradiated with input EM radiation having an input wavefront. An amount of frequency shifted EM radiation is detected, wherein at least some of the input EM radiation that passes through the acoustic field at the targets is shifted in frequency to form the frequency shifted EM radiation. The input wavefront is modified, using feedback comprising the amount of the frequency shifted EM radiation that is detected, into a modified wavefront. The sample is irradiated using the input EM radiation comprising the modified wavefront, and the process is repeated as desired.


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