The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2019
Filed:
Sep. 23, 2016
Applicant:
California Institute of Technology, Pasadena, CA (US);
Inventors:
Morteza Gharib, Altadena, CA (US);
David Jeon, Pasadena, CA (US);
Assignee:
CALIFORNIA INSTITUTE OF TECHNOLOGY, Pasadena, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 9/47 (2006.01); H04N 13/106 (2018.01); H04N 13/211 (2018.01); H04N 13/236 (2018.01); H04N 13/246 (2018.01); H04N 13/271 (2018.01); G06T 7/571 (2017.01); G02B 3/00 (2006.01);
U.S. Cl.
CPC ...
H04N 13/106 (2018.05); G02B 3/0056 (2013.01); G06T 7/571 (2017.01); H04N 13/211 (2018.05); H04N 13/236 (2018.05); H04N 13/246 (2018.05); H04N 13/271 (2018.05); G06T 2207/10012 (2013.01); G06T 2207/10016 (2013.01);
Abstract
Hardware and software methodology are described for three-dimensional imaging in connection with a single sensor. A plurality of images is captured at different degrees of focus without focus change of an objective lens between such images. Depth information is extracted by comparing image blur between the images captured on the single sensor.