The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2019

Filed:

Dec. 05, 2014
Applicant:

Dell Software Inc., Aliso Viejo, CA (US);

Inventors:

Joseph Rustad, Toronto, CA;

Xiangrui Wang, Burlington, CA;

Philip Jackson, Asheville, NC (US);

Assignee:

Quest Software Inc., Aliso Viejo, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 43/04 (2013.01); H04L 43/0823 (2013.01);
Abstract

In one embodiment, a method includes identifying at least one transaction-path node as a problem node based, at least in part, on an analysis of end-to-end response times for a group of transactions. The method further includes determining one or more event types for the at least one transaction-path node. Also, the method includes, for each of the one or more event types, inferring a first event-relevance weight from an abstract model. The method also includes, for each of the one or more event types, inferring a second event-relevance weight from a concrete model. Furthermore, the method includes, for each of the one or more event types, determining an event relevance based, at least in part, on the first event-relevance weight and the second event-relevance weight. Additionally, the method includes identifying most-relevant events among a set of active events based, at least in part, on the determined event relevance.


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