The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2019
Filed:
Aug. 02, 2016
Applicant:
Vayyar Imaging Ltd., Yehud, IL;
Inventors:
Damian Hoffman, Tzur Yitzhak, IL;
Jonathan Rosenfeld, Ramat hasharon, IL;
Assignee:
VAYYAR IMAGING LTD, Yehud, IL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 15/02 (2006.01); H01Q 17/00 (2006.01); H01Q 21/00 (2006.01); H01Q 1/22 (2006.01); H01Q 1/24 (2006.01); H01Q 5/00 (2015.01); H01Q 21/06 (2006.01);
U.S. Cl.
CPC ...
H01Q 17/00 (2013.01); H01Q 1/225 (2013.01); H01Q 1/243 (2013.01); H01Q 5/00 (2013.01); H01Q 21/00 (2013.01); H01Q 21/061 (2013.01);
Abstract
A system and methods for RF (Radio Frequency) penetration imaging of one or more objects in a medium, the system comprising: a generation and reception unit configured to generate and receive RF signals; an antenna array configured to transmit/receive the RF signals, the antenna array comprises a plurality of antennas: and a processor in communication with said antenna array, said processor is configured to analyze said RF signals and estimate the distance between the antenna array and the object, and in addition the relative orientation between the antenna array and the medium surface.