The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2019

Filed:

Feb. 14, 2017
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Hao Long, Chengdu, CN;

Fusheng Tang, Segrate, IT;

Zhuo Zeng, Chengdu, CN;

Yanxing Luo, Chengdu, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 3/24 (2006.01); H01Q 15/14 (2006.01); H01Q 3/40 (2006.01); H01Q 19/10 (2006.01);
U.S. Cl.
CPC ...
H01Q 15/14 (2013.01); H01Q 3/24 (2013.01); H01Q 3/40 (2013.01); H01Q 19/10 (2013.01);
Abstract

A beam scanning antenna, a microwave system, and a beam alignment method are disclosed. The method includes: instructing, by a switching control module, a feed switching module to enable each feed in a multi-feed antenna, so that the feeds separately perform signal quality detection, where the multi-feed antenna includes an aperture unit and at least two feeds, where the feeds are configured to radiate an electromagnetic wave signal, the feed switching module includes multiple switches, and each feed is respectively connected to one switch in the feed switching module; acquiring, by the switching control module, a result of the signal quality detection performed by each feed; and selecting, by the switching control module according to the result of the signal quality detection, one feed having the best signal quality as a working feed.


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