The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2019

Filed:

Aug. 05, 2015
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Naoto Ueda, Hyogo, JP;

Kouji Oomori, Shiga, JP;

Takayuki Yoshida, Shiga, JP;

Takuma Motofuji, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 5/024 (2006.01); H01L 23/373 (2006.01); H01L 23/36 (2006.01); H01L 23/48 (2006.01); H01L 25/07 (2006.01); H01L 25/18 (2006.01); H01S 5/042 (2006.01); H01L 23/06 (2006.01); H01L 23/13 (2006.01); H01L 23/14 (2006.01); H01L 23/40 (2006.01); H01L 23/00 (2006.01); H01S 5/022 (2006.01); H01L 29/861 (2006.01);
U.S. Cl.
CPC ...
H01L 23/3731 (2013.01); H01L 23/06 (2013.01); H01L 23/13 (2013.01); H01L 23/142 (2013.01); H01L 23/36 (2013.01); H01L 23/3736 (2013.01); H01L 23/4006 (2013.01); H01L 23/48 (2013.01); H01L 24/13 (2013.01); H01L 24/16 (2013.01); H01L 25/07 (2013.01); H01L 25/18 (2013.01); H01S 5/024 (2013.01); H01S 5/02236 (2013.01); H01S 5/042 (2013.01); H01S 5/0425 (2013.01); H01L 29/861 (2013.01); H01L 2023/4043 (2013.01); H01L 2023/4068 (2013.01); H01L 2224/13144 (2013.01); H01L 2224/16245 (2013.01); H01L 2924/0002 (2013.01); H01L 2924/1203 (2013.01); H01L 2924/12042 (2013.01); H01L 2924/15153 (2013.01); H01L 2924/16235 (2013.01); H01L 2924/16251 (2013.01);
Abstract

A semiconductor device according to the present disclosure includes an electrically conductive first electrode block, an electrically conductive submount, an insulating layer, a semiconductor element, an electrically conductive bump, and an electrically conductive second electrode block. The submount is provided in a first region of the upper surface of the first electrode block, and electrically connected to the first electrode block. The semiconductor element is provided on the submount, and has a first electrode electrically connected to the submount. The bump is provided on the upper surface of a second electrode, opposite the first electrode, of the semiconductor element, and electrically connected to the second electrode. A third region of the lower surface of the second electrode block is electrically connected to the bump via an electrically conductive metal layer. An electrically conductive metal sheet is provided between the metal layer and the bump.


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