The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2019

Filed:

Apr. 19, 2013
Applicant:

Battelle Memorial Institute, Richland, WA (US);

Inventors:

Kevin Crowell, Richland, WA (US);

Spencer A. Prost, Tempe, AZ (US);

Assignee:

Battelle Memorial Institute, Richland, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); G06F 19/00 (2018.01);
U.S. Cl.
CPC ...
H01J 49/0036 (2013.01); G06F 19/703 (2013.01);
Abstract

Apparatus and methods are disclosed for processing data transformed according to an invertible transform (e.g., using a Hadamard transform) multiplexing scheme. In one example of the disclosed technology, a computer-implemented method includes generating transformed data by applying a Hadamard transform to intensity data generated by modulating input of analytes into a mass spectrometer according to a pseudorandom sequence (PRS). The exemplary method further includes identifying at least one pair of symmetric intensity peaks in the transformed data based on the PRS and removing data associated with the pair of symmetric peaks from the transformed data to produce modified data, which can be used to identify, characterize, and/or quantify the composition of the sample. In some examples, the exemplary method further includes validating peaks in the transformed data based on comparing the location of peaks in the untransformed intensity data.


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