The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2019

Filed:

Aug. 05, 2016
Applicant:

Trumpf Huettinger Sp. Z O.o., Zielonka, PL;

Inventors:

Andrzej Gieraltowski, Warsaw, PL;

Adam Grabowski, Plonsk, PL;

Piotr Lach, Wolomin, PL;

Marcin Zelechowski, Warsaw, PL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); G01R 19/165 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32944 (2013.01); G01R 19/165 (2013.01); H01J 37/32128 (2013.01); H01J 37/32917 (2013.01); H01J 37/32926 (2013.01); H01J 37/32935 (2013.01);
Abstract

Systems and methods of monitoring a discharge in a plasma process are disclosed. The methods include supplying the plasma process with a periodic power supply signal, determining a first signal waveform in a first time interval within a first period of the power supply signal, determining a second signal waveform in a second time interval within a second period of the power supply signal, the second time interval being at a position within the second period corresponding to a position of the first time interval within the first period, comparing the second signal waveform with a reference signal waveform to obtain a first comparison result, determining that the first comparison result corresponds to a given first comparison result, and in response, time-shifting one of the second signal waveform and the reference signal waveform, and comparing the time-shifted signal waveform with the non-time-shifted signal waveform to obtain a second comparison result.


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