The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2019
Filed:
Jun. 16, 2017
Applicant:
Imatrex, Inc., Las Vegas, NV (US);
Inventors:
Roy E. Rand, Portola Valley, CA (US);
Vitaliy Ziskin, Newton, MA (US);
Assignee:
IMATREX, INC., Las Vegas, NV (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/147 (2006.01); H01J 37/153 (2006.01); H01J 37/08 (2006.01); H01J 37/26 (2006.01); H01J 37/317 (2006.01);
U.S. Cl.
CPC ...
H01J 37/1475 (2013.01); H01J 37/08 (2013.01); H01J 37/153 (2013.01); H01J 37/266 (2013.01); H01J 37/3174 (2013.01); H01J 2237/1526 (2013.01); H01J 2237/2806 (2013.01); H01J 2237/31749 (2013.01);
Abstract
A particle beam device including a magnet, the device including: a particle beam source configured to emit electron and ion beams; a plurality of yokes arranged in a substantially rectangular shape; a coil set including a plurality of coils, wherein windings of the plurality of coils are uniformly distributed across and wound around the plurality of yokes, wherein the coil set is configured to produce both dipole and quadrupole fields, wherein the magnet is configured to deflect and focus electron and ion beams.